Seminars Archive

Soft matter structure measurement by Polarized Resonant Soft X-ray Scattering

Dean M. DeLongchamp (National Institute of Standards and Technology, USA)
Fri 18 May, at 11:00 - Seminar Room T1

Abstract
In many applications of soft matter, the connection between structure and performance is complex, and conventional structure measurements are not sufficient to provide a predictive structural model. Nanoscale variations in molecular orientation and composition, particularly in amorphous regions, are thought to be critical, but few techniques can probe them. I will describe our approach to polarized resonant soft X-ray scattering (P-RSoXS), which combines principles of spectroscopy, small-angle scattering, real-space imaging, and molecular simulation to produce a molecular scale structure measurement for soft materials and complex fluids. Results from model systems including commodity plastics, block copolymers, and organic photovoltaics blends will be discussed. An emphasis will be placed on connections between P-RSoXS and conventional small angle X-ray scattering (SAXS) and small angle neutron scattering (SANS), including different contrast approaches, different experimental considerations, and unique measurement capabilities of each technique. I will also describe progress and designs for a new P-RSoXS beamline that we are constructing at the National Synchrotron Light Source II (NSLS-II).

(Referer: L. Pasquali)
Last Updated on Tuesday, 24 April 2012 15:21